12-14 December 2022
IIT Jodhpur
Asia/Kolkata timezone

DIAGNOSTIC OF LASER ABLATED SILICON PLASMA USING TIME DEPENDENT CR MODEL WITH FULLY RELATIVISTIC ELECTRON EXCITATION CROSS-SECTION OF Si+2

Not scheduled
20m
IIT Jodhpur

IIT Jodhpur

Indian Institute of Technology, Jodhpur NH 62, Nagaur Road, Karwar, Jodhpur
Poster Plasma Diagnostics

Speaker

Shubham Singh Baghel (Indian Institute of Technology Roorkee)

Primary author

Shubham Singh Baghel (Indian Institute of Technology Roorkee)

Co-authors

Mrs Priti Priti (National institute for fusion science, 322-6 Oroshicho, Toki, Gifu, Japan 509-5202) Mr Rajesh Srivastava (Department of Physics, Indian Institute of Technology Roorkee, Roorkee-247667)

Presentation materials

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